relationship between two parties, where both have the same rights and obligations towards each other
Notes
Note 1 to entry: Reciprocity can exist within a multilateral arrangement, comprising a network of bilateral reciprocal relationships.
Note 2 to entry: Although the rights and obligations of the parties are the same, opportunities emanating from them can differ. This can lead to unequal relationships between parties.
[ISO/IEC 17000:2020, 9.11]
Table of Contents
Contents
0. Basic terms
- 0.01 metrology
- 0.02 International System of Units
- 0.03 indication
- 0.04 error of indication
- 0.05 maximum permissible measurement error
- 0.06 intrinsic error
- 0.07 influence quantity
- 0.08 rated operating condition
- 0.09 reference operating condition
- 0.10 measuring instrument
- 0.11 measuring transducer
- 0.12 measuring system
- 0.13 scale of a displaying measuring instrument
- 0.14 calibration
- 0.15 adjustment of a measuring system
1. Metrology and its legal aspects
2. Legal metrology activities
- 2.01 legal metrological control
- 2.02 legal control of measuring instruments
- 2.03 metrological supervision
- 2.04 type (pattern) evaluation
- 2.05 type approval
- 2.06 type approval with limited effect
- 2.07 recognition of type approval
- 2.08 withdrawal of a type approval
- 2.09 verification of a measuring instrument
- 2.10 preliminary examination
- 2.11 verification by sampling
- 2.12 initial verification
- 2.13 subsequent verification
- 2.14 mandatory periodic verification
- 2.15 rejection of a measuring instrument
- 2.16 requalification of a measuring instrument
- 2.17 recognition of verification
- 2.18 inspection by sampling
- 2.19 marking
- 2.20 sealing
- 2.21 securing
- 2.22 obliteration of a verification mark
- 2.23 initial verification of measuring instruments utilizing the manufacturer's quality management system
- 2.24 placing on the market
3. Documents and marks within legal metrology
4. Classification of measuring instruments
- 4.01 category of instruments
- 4.02 family of measuring instruments
- 4.03 metrologically relevant
- 4.04 module
- 4.05 family of modules
- 4.06 type of a measuring instrument or module
- 4.07 legally controlled measuring instrument
- 4.08 legally relevant
- 4.09 specimen of an approved type
- 4.10 legally relevant parameter
- 4.11 type-specific parameter
- 4.12 device-specific parameter
- 4.13 approved type
- 4.14 measuring instrument acceptable for verification
- 4.15 verification equipment
- 4.16 equipment under test
5. Construction and operation of measuring instruments
- 5.01 scale interval
- 5.02 verification scale interval
- 5.03 number of verification scale intervals
- 5.04 indicating device
- 5.05 primary indication
- 5.06 ancillary device
- 5.07 checking facility
- 5.08 control instrument
- 5.09 associated measuring instrument
- 5.10 terminal
- 5.11 initial intrinsic error
- 5.12 fault
- 5.13 fault limit
- 5.14 significant fault
- 5.15 durability
- 5.16 durability error
- 5.17 significant durability error
- 5.18 influence factor
- 5.19 disturbance
- 5.20 test program
- 5.21 performance test
- 5.22 durability test
6. Software in legal metrology
Annex A Terms relating to conformity assessment (Normative)
- A.1 conformity assessment
- A.2 conformity assessment body
- A.3 accreditation body
- A.4 conformity assessment system
- A.5 conformity assessment scheme
- A.6 specified requirement
- A.7 procedure
- A.8 certification scheme
- A.9 sampling
- A.10 testing
- A.11 inspection
- A.12 audit
- A.13 peer assessment
- A.14 review
- A.15 attestation
- A.16 scope of attestation
- A.17 declaration (of conformity)
- A.18 certification
- A.19 accreditation
- A.20 surveillance
- A.21 suspension
- A.22 appeal
- A.23 complaint
- A.24 agreement group
- A.25 approval
- A.26 reciprocity
- A.27 equal treatment
- A.28 national treatment
- A.29 equal and national treatment
- A.30 designation
- A.31 designating authority
- A.32 equivalence
- A.33 recognition
- A.34 acceptance
- A.35 unilateral arrangement
- A.36 bilateral arrangement
- A.37 multilateral arrangement
| International Organization of Legal Metrology (OIML) |  |
11, rue Turgot - 75009 Paris - France |